JACoW is a publisher in Geneva, Switzerland that publishes the proceedings of accelerator conferences held around the world by an international collaboration of editors.
TY - CONF AU - Cierpka, A. AU - Keckert, S. AU - Knobloch, J. AU - Kramer, F. AU - Kugeler, O. ED - Saito, Kenji ED - Xu, Ting ED - Sakamoto, Naruhiko ED - Schaa, Volker R.W. ED - Thomas, Paul W. TI - Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials J2 - Proc. of SRF2023, Grand Rapids, MI, USA, 25-30 June 2023 CY - Grand Rapids, MI, USA T2 - International Conference on RF Superconductivity T3 - 21 LA - english AB - Temperature mapping systems have been used for many years to detect local heating in an SRF cavity surface or materials sample. They require a large number of temperature sensors. Most often, low-cost Allen-Bradley resistors are used for this purpose. Since they have poor sensitivity and reproducibility above 4 K, sensor alternatives that combine the precision of Cernox sensors with the low-cost of Allen-Bradley resistors would be highly desirable. In this work various semiconductor components that exhibit a temperature dependent electrical response, such as diodes and LEDs were analyzed with respect to sensitivity, reproducibility and response speed in a temperature range between 6.5 K and 22 K. In this range, many diodes and LEDs were found to be more sensitive than Cernox sensors. However, in some components the response time was slow - possibly due to poor thermal contact. PB - JACoW Publishing CP - Geneva, Switzerland SP - 80 EP - 83 KW - cavity KW - controls KW - cryogenics KW - experiment KW - SRF DA - 2023/09 PY - 2023 SN - 2673-5504 SN - 978-3-95450-234-9 DO - doi:10.18429/JACoW-SRF2023-MOPMB010 UR - https://jacow.org/srf2023/papers/mopmb010.pdf ER -