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Text/Word citation export for MOPMB010: Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials

A. Cierpka, S. Keckert, J. Knobloch, F. Kramer, and O. Kugeler, “Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials”, in Proc. 21th Int. Conf. RF Supercond. (SRF'23), Grand Rapids, MI, USA, Jun. 2023, pp. 80-83. doi:10.18429/JACoW-SRF2023-MOPMB010