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BiBTeX citation export for MOPMB013: Influence of the Coating Parameters on the Tc of Nb₃Sn Thin Films on Copper Deposited via DC Magnetron Sputtering

@inproceedings{fonnesu:srf2023-mopmb013,
  author       = {D. Fonnesu and O. Azzolini and R. Caforio and E. Chyhyrynets and D. Ford and V.A. Garcia and G. Keppel and G. Marconato and C. Pira and A. Salmaso and F. Stivanello},
% author       = {D. Fonnesu and O. Azzolini and R. Caforio and E. Chyhyrynets and D. Ford and V.A. Garcia and others},
% author       = {D. Fonnesu and others},
  title        = {{Influence of the Coating Parameters on the Tc of Nb₃Sn Thin Films on Copper Deposited via DC Magnetron Sputtering}},
% booktitle    = {Proc. SRF'23},
  booktitle    = {Proc. 21th Int. Conf. RF Supercond. (SRF'23)},
  pages        = {92--95},
  eid          = {MOPMB013},
  language     = {english},
  keywords     = {site, niobium, cavity, SRF, cathode},
  venue        = {Grand Rapids, MI, USA},
  series       = {International Conference on RF Superconductivity},
  number       = {21},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {09},
  year         = {2023},
  issn         = {2673-5504},
  isbn         = {978-3-95450-234-9},
  doi          = {10.18429/JACoW-SRF2023-MOPMB013},
  url          = {https://jacow.org/srf2023/papers/mopmb013.pdf},
  abstract     = {{The I.FAST collaboration aims at pushing the performance of particle accelerators by developing sustainable innovative technologies. Among its goals, the development of thin film-coated copper elliptical accelerating cavities covers both the optimization of the manufacturing of seamless substrates and the development of functional coatings able to conform to the 3D cavity geometry while delivering the needed performance. For the latter, the optimization of the deposition recipe is central to a successful outcome. The work presented here focuses on the deposition of Nb₃Sn films on flat, small copper samples. The films are deposited via DCMS from a planar stoichiometric Nb₃Sn commercial target. The results of the film characterization are presented here. The observed dependencies between the film properties and, in particular, Tc(90%-10%) = (17.9±0.1)K is reported for Nb₃Sn on sapphire and Tc(90%-10%) = (16.9±0.2)K for Nb₃Sn on copper with a 30 micron thick niobium buffer layer.}},
}