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BiBTeX citation export for MOPMB042: Evaluation of Flux Expulsion and Flux Trapping Sensitivity of SRF Cavities Fabricated from Cold Work Nb Sheet with Successive Heat Treatment

@inproceedings{khanal:srf2023-mopmb042,
  author       = {B.D. Khanal and P. Dhakal},
  title        = {{Evaluation of Flux Expulsion and Flux Trapping Sensitivity of SRF Cavities Fabricated from Cold Work Nb Sheet with Successive Heat Treatment}},
% booktitle    = {Proc. SRF'23},
  booktitle    = {Proc. 21th Int. Conf. RF Supercond. (SRF'23)},
  pages        = {197--201},
  eid          = {MOPMB042},
  language     = {english},
  keywords     = {cavity, SRF, niobium, ECR, radio-frequency},
  venue        = {Grand Rapids, MI, USA},
  series       = {International Conference on RF Superconductivity},
  number       = {21},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {09},
  year         = {2023},
  issn         = {2673-5504},
  isbn         = {978-3-95450-234-9},
  doi          = {10.18429/JACoW-SRF2023-MOPMB042},
  url          = {https://jacow.org/srf2023/papers/mopmb042.pdf},
  abstract     = {{The main source of RF losses leading to lower quality factor of superconducting radio-frequency cavities is due to the residual magnetic flux trapped during cool-down. The loss due to flux trapping is more pronounced for cavities subjected to impurities doping. The flux trapping and its sensitivity to rf losses are related to several intrinsic and extrinsic phenomena. To elucidate the effect of re-crystallization by high temperature heat treatment on the flux trapping sensitivity, we have fabricated two 1.3 GHz single cell cavities from cold-worked Nb sheets and compared with cavities made from standard fine-grain Nb. Flux expulsion ratio and flux trapping sensitivity were measured after successive high temperature heat treatments. The cavity made from cold worked Nb showed better flux expulsion after 800 C/3h heat treatment and similar behavior when heat treated with additional 900 C/3h and 1000 C/3h. In this contribution, we present the summary of flux expulsion, trapping sensitivity, and RF results.}},
}