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RIS citation export for MOPMB044: Topographic Evolution of Nitrogen Doped Nb Subjected to Electropolishing

TY  - CONF
AU  - Lechner, E.M.
AU  - Angle, J.W.
AU  - Baxley, C.G.
AU  - Kelley, M.J.
AU  - Reece, C.E.
ED  - Saito, Kenji
ED  - Xu, Ting
ED  - Sakamoto, Naruhiko
ED  - Schaa, Volker R.W.
ED  - Thomas, Paul W.
TI  - Topographic Evolution of Nitrogen Doped Nb Subjected to Electropolishing
J2  - Proc. of SRF2023, Grand Rapids, MI, USA, 25-30 June 2023
CY  - Grand Rapids, MI, USA
T2  - International Conference on RF Superconductivity
T3  - 21
LA  - english
AB  - Surface quality is paramount in facilitating high perfor-mance SRF cavity operation. Here, we investigate the topographic evolution of samples subjected to N-doping and 600 °C vacuum anneal. We show that in N-doped Nb, niobium nitrides may grow continuously along grain boundaries. Upon electropolishing high slope angle grooves are revealed which sets up a condition that may facilitate a supression of the superheating field.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 207
EP  - 210
KW  - SRF
KW  - cavity
KW  - niobium
KW  - vacuum
KW  - ECR
DA  - 2023/09
PY  - 2023
SN  - 2673-5504
SN  - 978-3-95450-234-9
DO  - doi:10.18429/JACoW-SRF2023-MOPMB044
UR  - https://jacow.org/srf2023/papers/mopmb044.pdf
ER  -