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RIS citation export for WEPWB050: Exploring Innovative Pathway for SRF Cavity Fabrication

TY  - CONF
AU  - Hryhorenko, O.
AU  - Antoine, C.Z.
AU  - Dohmae, T.
AU  - Longuevergne, D.
AU  - Valizadeh, R.
ED  - Saito, Kenji
ED  - Xu, Ting
ED  - Sakamoto, Naruhiko
ED  - Schaa, Volker R.W.
ED  - Thomas, Paul W.
TI  - Exploring Innovative Pathway for SRF Cavity Fabrication
J2  - Proc. of SRF2023, Grand Rapids, MI, USA, 25-30 June 2023
CY  - Grand Rapids, MI, USA
T2  - International Conference on RF Superconductivity
T3  - 21
LA  - english
AB  - This article shows a study on an alternative pathway for the fabrication of a complete 1.3 GHz SRF cavity, aiming at improving production reliability, reducing the use of chemical polishing (EP or BCP) which is a costly and safety-critical step, and preserving surface quality after forming. Unlike the conventional pathway, the fabrication process is performed after polishing. This point is crucial as the used polishing technology could be applied only to flat geometries. The performed investigation demonstrates that damages during the fabrication process are considered minor, localized, and limited to the near-surface. Moreover, these studies confirm that the damaged layer (100-200 µm) is mainly caused by the rolling process, and not by the subsequent fabrication steps. A laser confocal microscope and SEM-EBSD technique were used to compare samples before and after forming. The preliminary results are discussed and presented in this paper.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 680
EP  - 684
KW  - cavity
KW  - SRF
KW  - niobium
KW  - laser
KW  - electron
DA  - 2023/09
PY  - 2023
SN  - 2673-5504
SN  - 978-3-95450-234-9
DO  - doi:10.18429/JACoW-SRF2023-WEPWB050
UR  - https://jacow.org/srf2023/papers/wepwb050.pdf
ER  -