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BiBTeX citation export for WEPWB052: Temperature, RF Field, and Frequency Dependence Performance Evaluation of Superconducting Niobium Half-Wave Coaxial Cavity

@inproceedings{raut:srf2023-wepwb052,
  author       = {N.K. Raut and G. Ciovati and S.U. De Silva and J.R. Delayen and P. Dhakal and B.D. Khanal and J.K. Tiskumara},
% author       = {N.K. Raut and G. Ciovati and S.U. De Silva and J.R. Delayen and P. Dhakal and B.D. Khanal and others},
% author       = {N.K. Raut and others},
  title        = {{Temperature, RF Field, and Frequency Dependence Performance Evaluation of Superconducting Niobium Half-Wave Coaxial Cavity}},
% booktitle    = {Proc. SRF'23},
  booktitle    = {Proc. 21th Int. Conf. RF Supercond. (SRF'23)},
  pages        = {691--695},
  eid          = {WEPWB052},
  language     = {english},
  keywords     = {cavity, niobium, SRF, radio-frequency, experiment},
  venue        = {Grand Rapids, MI, USA},
  series       = {International Conference on RF Superconductivity},
  number       = {21},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {09},
  year         = {2023},
  issn         = {2673-5504},
  isbn         = {978-3-95450-234-9},
  doi          = {10.18429/JACoW-SRF2023-WEPWB052},
  url          = {https://jacow.org/srf2023/papers/wepwb052.pdf},
  abstract     = {{Recent advancement in superconducting radio frequency cavity processing techniques, with diffusion of impurities within the RF penetration depth, resulted in high quality factor with increase in quality factor with increasing accelerating gradient. The increase in quality factor is the result of a decrease in the surface resistance as a result of nonmagnetic impurities doping and change in electronic density of states. The fundamental understanding of the dependence of surface resistance on frequency and surface preparation is still an active area of research. Here, we present the result of RF measurements of the TEM modes in a coaxial half-wave niobium cavity resonating at frequencies between 0.3 - 1.3 GHz. The temperature dependence of the surface resistance was measured between 4.2 K and 1.6 K. The field dependence of the surface resistance was measured at 2.0 K. The baseline measurements were made after standard surface preparation by buffered chemical polishing.}},
}