Author: Hu, H.
Paper Title Page
MOPMB040 Comparing the Effectiveness of Low Temperature Bake in EP and BCP Cavities 187
SUSPB014   use link to see paper's listing under its alternate paper code  
 
  • H. Hu, Y.K. Kim
    University of Chicago, Chicago, Illinois, USA
  • D. Bafia
    Fermilab, Batavia, Illinois, USA
 
  Funding: This manuscript has been authored by Fermi Research Alliance, LLC under Contract No. DE-AC02-07CH11359 with the U.S. Department of Energy, Office of Science, Office of High Energy Physics.
Electropolishing (EP) and buffered chemical polishing (BCP) are conventional surface preparation techniques for superconducting radiofrequency (SRF) cavities. Both EP and BCP treated SRF cavities display high field Q-slope (HFQS) which degrades performance at high gradients. While high gradient performance in EP cavities can be improved by introducing oxygen via a low temperature bake (LTB) of 120°C by 48 hours, LTB does not consistently remove HFQS in BCP cavities. There is no consensus as to why LTB is not effective on BCP prepared cavities. We examine quench in EP, BCP, EP+LTB, and BCP+LTB treated 1.3 GHz single-cell Nb cavities by studying the heating behavior with field using a temperature mapping system. Cavity performance is correlated to characterizations of surface impurity profile obtained via time of flight secondary ion mass spectrometry studies. We observe a difference in near surface hydrogen concentration following BCP compared to EP that may suggest that the causes of quench in EP and BCP cavities are different.
 
DOI • reference for this paper ※ doi:10.18429/JACoW-SRF2023-MOPMB040  
About • Received ※ 14 June 2023 — Revised ※ 28 June 2023 — Accepted ※ 29 June 2023 — Issue date ※ 03 July 2023
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