HZBdownload RIS dataset for institute's DOIs
Berlin, Germany
DOI | Title |
---|---|
10.18429/JACoW-SRF2023-MOPMB010 | Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials |
10.18429/JACoW-SRF2023-TUCXA01 | Study of the Dynamics of Flux Trapping in Different SRF Materials |
10.18429/JACoW-SRF2023-TUPTB002 | Modelling Trapped Flux in Niobium |
10.18429/JACoW-SRF2023-TUPTB013 | Commissioning of a New Sample Test Cavity for Rapid RF Characterization of SRF Materials |
10.18429/JACoW-SRF2023-WECAA01 | Progress in European Thin Film Activities |
10.18429/JACoW-SRF2023-WEIXA06 | Recent Advances in Metallographic Polishing for SRF Application |