HZBdownload RIS dataset for institute's DOIs
Berlin, Germany

DOI Title
10.18429/JACoW-SRF2023-MOPMB010 Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials
10.18429/JACoW-SRF2023-TUCXA01 Study of the Dynamics of Flux Trapping in Different SRF Materials
10.18429/JACoW-SRF2023-TUPTB002 Modelling Trapped Flux in Niobium
10.18429/JACoW-SRF2023-TUPTB013 Commissioning of a New Sample Test Cavity for Rapid RF Characterization of SRF Materials
10.18429/JACoW-SRF2023-WECAA01 Progress in European Thin Film Activities
10.18429/JACoW-SRF2023-WEIXA06 Recent Advances in Metallographic Polishing for SRF Application