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MOPMB010 |
Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials |
80 |
SUSPB006 |
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- A. Cierpka, S. Keckert, J. Knobloch, F. Kramer, O. Kugeler
HZB, Berlin, Germany
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Temperature mapping systems have been used for many years to detect local heating in an SRF cavity surface or materials sample. They require a large number of temperature sensors. Most often, low-cost Allen-Bradley resistors are used for this purpose. Since they have poor sensitivity and reproducibility above 4 K, sensor alternatives that combine the precision of Cernox sensors with the low-cost of Allen-Bradley resistors would be highly desirable. In this work various semiconductor components that exhibit a temperature dependent electrical response, such as diodes and LEDs were analyzed with respect to sensitivity, reproducibility and response speed in a temperature range between 6.5 K and 22 K. In this range, many diodes and LEDs were found to be more sensitive than Cernox sensors. However, in some components the response time was slow - possibly due to poor thermal contact.
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DOI • |
reference for this paper
※ doi:10.18429/JACoW-SRF2023-MOPMB010
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About • |
Received ※ 08 June 2023 — Revised ※ 22 June 2023 — Accepted ※ 26 June 2023 — Issue date ※ 17 July 2023 |
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