SRF2023 - List of Authors (Antoine, C.Z.)

Paper	Title	Page
WECAA01	Progress in European Thin Film Activities	607
	C. Pira, O. Azzolini, R. Caforio, E. Chyhyrynets, D. Fonnesu, D. Ford, V.A. Garcia, G. Keppel, G. Marconato, A. Salmaso, F. Stivanello INFN/LNL, Legnaro (PD), Italy C.Z. Antoine, Y. Kalboussi, Th. Proslier CEA-IRFU, Gif-sur-Yvette, France C. Benjamin, O.B. Malyshev, N. Marks, B.S. Sian, R. Valizadeh STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom C. Benjamin, J.W. Bradley, G. Burt, O.B. Malyshev, N. Marks, D.J. Seal, B.S. Sian, S. Simon, D.A. Turner, R. Valizadeh Cockcroft Institute, Warrington, Cheshire, United Kingdom S. Berry CEA-DRF-IRFU, France R. Berton, D. Piccoli, F. Piccoli, G. Squizzato, F. Telatin Piccoli, Noale (VE), Italy M. Bertucci, R. Paparella INFN/LASA, Segrate (MI), Italy M. Bonesso, S. Candela, V. Candela, R. Dima, G. Favero, A. Pepato, P. Rebesan, M. Romanato INFN- Sez. di Padova, Padova, Italy J.W. Bradley, S. Simon The University of Liverpool, Liverpool, United Kingdom G. Burt, D.J. Seal, D.A. Turner Lancaster University, Lancaster, United Kingdom O. Hryhorenko, D. Longuevergne Université Paris-Saclay, CNRS/IN2P3, IJCLab, Orsay, France X. Jiang, T. Staedler, A.O. Zubtsovskii University Siegen, Siegen, Germany S. Keckert, J. Knobloch, O. Kugeler HZB, Berlin, Germany J. Knobloch University of Siegen, Siegen, Germany N.L. Leicester Cockcroft Institute, Lancaster University, Lancaster, United Kingdom A. Medvids, A. Mychko, P. Onufrijevs Riga Technical University, Riga, Latvia S. Prucnal, S. Zhou HZDR, Dresden, Germany R. Ries Slovak Academy of Sciences, Institute of Electrical Engineering, Bratislava, Slovak Republic E. Seiler IEE, Bratislava, Slovak Republic L.G.P. Smith STFC/DL, Daresbury, Warrington, Cheshire, United Kingdom A-M. Valente-Feliciano JLab, Newport News, Virginia, USA
	Funding: This project has received funding from the European Union s Horizon 2020 Research and Innovation programme under Grant Agreement No 101004730. Thin-film cavities with higher Tc superconductors (SC) than Nb promise to move the operating temperature from 2 to 4.5 K with savings 3 orders of magnitude in cryogenic power consumption. Several European labs are coordinating their efforts to obtain a first 1.3 GHz cavity prototype through the I.FAST collaboration and other informal collaborations with CERN and DESY. R&D covers the entire production chain. In particular, new production techniques of seamless Copper and Niobium elliptical cavities via additive manufacturing are studied and evaluated. New acid-free polishing techniques to reduce surface roughness in a more sustainable way such as plasma electropolishing and metallographic polishing have been tested. Optimization of coating parameters of higher Tc SC than Nb (Nb₃Sn, V₃Si, NbTiN) via PVD and multilayer via ALD are on the way. Finally, rapid heat treatments such as Flash Lamp Annealing and Laser Annealing are used to avoid or reduce Cu diffusion in the SC film. The development and characterization of SC coatings is done on planar samples, 6 GHz cavities, choke cavities, QPR and 1.3 GHz cavities. This work presents the progress status of these coordinated efforts.
	Slides WECAA01 [15.846 MB]
DOI •	reference for this paper ※ doi:10.18429/JACoW-SRF2023-WECAA01
About •	Received ※ 18 June 2023 — Revised ※ 24 June 2023 — Accepted ※ 02 September 2023 — Issue date ※ 02 September 2023
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEIBA01	Surface Engineering by ALD for Superconducting RF Cavities	615
	Y. Kalboussi, C.Z. Antoine, M. Baudrier, Q. Bertrand, C. Boulch, B. Delatte, G. Jullien, L. Maurice, Th. Proslier, P. Sahuquet, T.V. Vacher CEA-IRFU, Gif-sur-Yvette, France M. Asaduzzaman, T. Junginger UVIC, Victoria, Canada M. Asaduzzaman TRIUMF, Vancouver, Canada D. Dragoe ICMMO, Orsay, France F. Éozénou CEA-DRF-IRFU, France N. Lochet CEA, DES, Université Paris-Saclay, Gif-sur-Yvette, France D. Longuevergne, T. Pépin-Donat Université Paris-Saclay, CNRS/IN2P3, IJCLab, Orsay, France F. Miserque CEA, LECA, Université Paris-Saclay, Gif-sur-Yvette, France
	Atomic Layer Deposition is a synthesis method that enable a unique control of thin films chemical composition and thickness over complex shape objects such as SRF cavities. This level of control opens the way to new surface treatments and to study their effect on RF cavity performances. We will present coupon and, in some cases, preliminary cavity results, from various surface engineering routes based on the deposition of thin oxides and nitrides films combined with post annealing treatments and study their interactions with the niobium. Three main research directions will be presented: 1/ replacing the niobium oxides by other surface layers (Al₂O₃, Y2O3, MgO) and probe their effect on the low and high field performances, 2/ doping with N and combine approaches 1/ and 2/ and finally 3/ optimize the superconducting properties of NbTiN multilayers on Nb and Sapphire.
	Slides WEIBA01 [13.613 MB]
DOI •	reference for this paper ※ doi:10.18429/JACoW-SRF2023-WEIBA01
About •	Received ※ 06 July 2023 — Revised ※ 12 August 2023 — Accepted ※ 19 August 2023 — Issue date ※ 19 August 2023
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEIXA06	Recent Advances in Metallographic Polishing for SRF Application	646
	O. Hryhorenko JLab, Newport News, Virginia, USA C.Z. Antoine, F. Éozénou, Th. Proslier Université Paris-Saclay, CEA, Gif-sur-Yvette, France T. Dohmae KEK, Ibaraki, Japan S. Keckert, J. Knobloch, O. Kugeler HZB, Berlin, Germany D. Longuevergne Université Paris-Saclay, CNRS/IN2P3, IJCLab, Orsay, France
	Funding: ENSAR-2 under grant agreement N° 654002. IFAST under Grant Agreement No 101004730. The U.S. Department of Energy, Office of Science, Office of Nuclear Physics under contract DE-AC05-06OR23177. This talk is an overview of the metallographic polishing R&D program covering Niobium and Copper substrates treatment for thin film coating as an alternative fabrication pathway for 1.3 GHz elliptical cavities. The presented research is the result of a collaborative effort between IJCLab, CEA/Irfu, HZB, and KEK in order to develop innovative surface processing and cavity fabrication protocols capable of meeting stringent requirements for SRF surfaces, including the reduction of safety risks and ecological footprint, enhancing reliability, improving the surface roughness, and potentially allowing cost reduction. The research findings will be disclosed.
	Slides WEIXA06 [7.469 MB]
DOI •	reference for this paper ※ doi:10.18429/JACoW-SRF2023-WEIXA06
About •	Received ※ 16 June 2023 — Revised ※ 27 June 2023 — Accepted ※ 28 June 2023 — Issue date ※ 14 July 2023
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPWB050	Exploring Innovative Pathway for SRF Cavity Fabrication	680
	O. Hryhorenko JLab, Newport News, Virginia, USA C.Z. Antoine Université Paris-Saclay, CEA, Gif-sur-Yvette, France T. Dohmae KEK, Ibaraki, Japan D. Longuevergne Université Paris-Saclay, CNRS/IN2P3, IJCLab, Orsay, France R. Valizadeh STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
	Funding: ENSAR-2 under grant agreement N° 654002. The U.S. Department of Energy, Office of Science, Office of Nuclear Physics under contract DE-AC05-06OR23177. This article shows a study on an alternative pathway for the fabrication of a complete 1.3 GHz SRF cavity, aiming at improving production reliability, reducing the use of chemical polishing (EP or BCP) which is a costly and safety-critical step, and preserving surface quality after forming. Unlike the conventional pathway, the fabrication process is performed after polishing. This point is crucial as the used polishing technology could be applied only to flat geometries. The performed investigation demonstrates that damages during the fabrication process are considered minor, localized, and limited to the near-surface. Moreover, these studies confirm that the damaged layer (100-200 µm) is mainly caused by the rolling process, and not by the subsequent fabrication steps. A laser confocal microscope and SEM-EBSD technique were used to compare samples before and after forming. The preliminary results are discussed and presented in this paper.
	Poster WEPWB050 [2.263 MB]
DOI •	reference for this paper ※ doi:10.18429/JACoW-SRF2023-WEPWB050
About •	Received ※ 20 June 2023 — Revised ※ 27 June 2023 — Accepted ※ 28 June 2023 — Issue date ※ 01 July 2023
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Progress in European Thin Film Activities

607

C. Pira, O. Azzolini, R. Caforio, E. Chyhyrynets, D. Fonnesu, D. Ford, V.A. Garcia, G. Keppel, G. Marconato, A. Salmaso, F. Stivanello
INFN/LNL, Legnaro (PD), Italy
C.Z. Antoine, Y. Kalboussi, Th. Proslier
CEA-IRFU, Gif-sur-Yvette, France
C. Benjamin, O.B. Malyshev, N. Marks, B.S. Sian, R. Valizadeh
STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
C. Benjamin, J.W. Bradley, G. Burt, O.B. Malyshev, N. Marks, D.J. Seal, B.S. Sian, S. Simon, D.A. Turner, R. Valizadeh
Cockcroft Institute, Warrington, Cheshire, United Kingdom
S. Berry
CEA-DRF-IRFU, France
R. Berton, D. Piccoli, F. Piccoli, G. Squizzato, F. Telatin
Piccoli, Noale (VE), Italy
M. Bertucci, R. Paparella
INFN/LASA, Segrate (MI), Italy
M. Bonesso, S. Candela, V. Candela, R. Dima, G. Favero, A. Pepato, P. Rebesan, M. Romanato
INFN- Sez. di Padova, Padova, Italy
J.W. Bradley, S. Simon
The University of Liverpool, Liverpool, United Kingdom
G. Burt, D.J. Seal, D.A. Turner
Lancaster University, Lancaster, United Kingdom
O. Hryhorenko, D. Longuevergne
Université Paris-Saclay, CNRS/IN2P3, IJCLab, Orsay, France
X. Jiang, T. Staedler, A.O. Zubtsovskii
University Siegen, Siegen, Germany
S. Keckert, J. Knobloch, O. Kugeler
HZB, Berlin, Germany
J. Knobloch
University of Siegen, Siegen, Germany
N.L. Leicester
Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
A. Medvids, A. Mychko, P. Onufrijevs
Riga Technical University, Riga, Latvia
S. Prucnal, S. Zhou
HZDR, Dresden, Germany
R. Ries
Slovak Academy of Sciences, Institute of Electrical Engineering, Bratislava, Slovak Republic
E. Seiler
IEE, Bratislava, Slovak Republic
L.G.P. Smith
STFC/DL, Daresbury, Warrington, Cheshire, United Kingdom
A-M. Valente-Feliciano
JLab, Newport News, Virginia, USA

Funding: This project has received funding from the European Union s Horizon 2020 Research and Innovation programme under Grant Agreement No 101004730.
Thin-film cavities with higher Tc superconductors (SC) than Nb promise to move the operating temperature from 2 to 4.5 K with savings 3 orders of magnitude in cryogenic power consumption. Several European labs are coordinating their efforts to obtain a first 1.3 GHz cavity prototype through the I.FAST collaboration and other informal collaborations with CERN and DESY. R&D covers the entire production chain. In particular, new production techniques of seamless Copper and Niobium elliptical cavities via additive manufacturing are studied and evaluated. New acid-free polishing techniques to reduce surface roughness in a more sustainable way such as plasma electropolishing and metallographic polishing have been tested. Optimization of coating parameters of higher Tc SC than Nb (Nb₃Sn, V₃Si, NbTiN) via PVD and multilayer via ALD are on the way. Finally, rapid heat treatments such as Flash Lamp Annealing and Laser Annealing are used to avoid or reduce Cu diffusion in the SC film. The development and characterization of SC coatings is done on planar samples, 6 GHz cavities, choke cavities, QPR and 1.3 GHz cavities. This work presents the progress status of these coordinated efforts.

Slides WECAA01 [15.846 MB]

DOI •

reference for this paper ※ doi:10.18429/JACoW-SRF2023-WECAA01

About •

Received ※ 18 June 2023 — Revised ※ 24 June 2023 — Accepted ※ 02 September 2023 — Issue date ※ 02 September 2023

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEIBA01

Surface Engineering by ALD for Superconducting RF Cavities

615

Y. Kalboussi, C.Z. Antoine, M. Baudrier, Q. Bertrand, C. Boulch, B. Delatte, G. Jullien, L. Maurice, Th. Proslier, P. Sahuquet, T.V. Vacher
CEA-IRFU, Gif-sur-Yvette, France
M. Asaduzzaman, T. Junginger
UVIC, Victoria, Canada
M. Asaduzzaman
TRIUMF, Vancouver, Canada
D. Dragoe
ICMMO, Orsay, France
F. Éozénou
CEA-DRF-IRFU, France
N. Lochet
CEA, DES, Université Paris-Saclay, Gif-sur-Yvette, France
D. Longuevergne, T. Pépin-Donat
Université Paris-Saclay, CNRS/IN2P3, IJCLab, Orsay, France
F. Miserque
CEA, LECA, Université Paris-Saclay, Gif-sur-Yvette, France

Atomic Layer Deposition is a synthesis method that enable a unique control of thin films chemical composition and thickness over complex shape objects such as SRF cavities. This level of control opens the way to new surface treatments and to study their effect on RF cavity performances. We will present coupon and, in some cases, preliminary cavity results, from various surface engineering routes based on the deposition of thin oxides and nitrides films combined with post annealing treatments and study their interactions with the niobium. Three main research directions will be presented: 1/ replacing the niobium oxides by other surface layers (Al₂O₃, Y2O3, MgO) and probe their effect on the low and high field performances, 2/ doping with N and combine approaches 1/ and 2/ and finally 3/ optimize the superconducting properties of NbTiN multilayers on Nb and Sapphire.

Slides WEIBA01 [13.613 MB]

DOI •

reference for this paper ※ doi:10.18429/JACoW-SRF2023-WEIBA01

About •

Received ※ 06 July 2023 — Revised ※ 12 August 2023 — Accepted ※ 19 August 2023 — Issue date ※ 19 August 2023

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEIXA06

Recent Advances in Metallographic Polishing for SRF Application

646

O. Hryhorenko
JLab, Newport News, Virginia, USA
C.Z. Antoine, F. Éozénou, Th. Proslier
Université Paris-Saclay, CEA, Gif-sur-Yvette, France
T. Dohmae
KEK, Ibaraki, Japan
S. Keckert, J. Knobloch, O. Kugeler
HZB, Berlin, Germany
D. Longuevergne
Université Paris-Saclay, CNRS/IN2P3, IJCLab, Orsay, France

Funding: ENSAR-2 under grant agreement N° 654002. IFAST under Grant Agreement No 101004730. The U.S. Department of Energy, Office of Science, Office of Nuclear Physics under contract DE-AC05-06OR23177.
This talk is an overview of the metallographic polishing R&D program covering Niobium and Copper substrates treatment for thin film coating as an alternative fabrication pathway for 1.3 GHz elliptical cavities. The presented research is the result of a collaborative effort between IJCLab, CEA/Irfu, HZB, and KEK in order to develop innovative surface processing and cavity fabrication protocols capable of meeting stringent requirements for SRF surfaces, including the reduction of safety risks and ecological footprint, enhancing reliability, improving the surface roughness, and potentially allowing cost reduction. The research findings will be disclosed.

Slides WEIXA06 [7.469 MB]

DOI •

reference for this paper ※ doi:10.18429/JACoW-SRF2023-WEIXA06

About •

Received ※ 16 June 2023 — Revised ※ 27 June 2023 — Accepted ※ 28 June 2023 — Issue date ※ 14 July 2023

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPWB050

Exploring Innovative Pathway for SRF Cavity Fabrication

680

O. Hryhorenko
JLab, Newport News, Virginia, USA
C.Z. Antoine
Université Paris-Saclay, CEA, Gif-sur-Yvette, France
T. Dohmae
KEK, Ibaraki, Japan
D. Longuevergne
Université Paris-Saclay, CNRS/IN2P3, IJCLab, Orsay, France
R. Valizadeh
STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom

Funding: ENSAR-2 under grant agreement N° 654002. The U.S. Department of Energy, Office of Science, Office of Nuclear Physics under contract DE-AC05-06OR23177.
This article shows a study on an alternative pathway for the fabrication of a complete 1.3 GHz SRF cavity, aiming at improving production reliability, reducing the use of chemical polishing (EP or BCP) which is a costly and safety-critical step, and preserving surface quality after forming. Unlike the conventional pathway, the fabrication process is performed after polishing. This point is crucial as the used polishing technology could be applied only to flat geometries. The performed investigation demonstrates that damages during the fabrication process are considered minor, localized, and limited to the near-surface. Moreover, these studies confirm that the damaged layer (100-200 µm) is mainly caused by the rolling process, and not by the subsequent fabrication steps. A laser confocal microscope and SEM-EBSD technique were used to compare samples before and after forming. The preliminary results are discussed and presented in this paper.

Poster WEPWB050 [2.263 MB]

DOI •

reference for this paper ※ doi:10.18429/JACoW-SRF2023-WEPWB050

About •

Received ※ 20 June 2023 — Revised ※ 27 June 2023 — Accepted ※ 28 June 2023 — Issue date ※ 01 July 2023

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)